Spectro introduces XEPOS ED-XRF spectrometers

Spectro Analytical Instruments, with headquarters in Germany and U.S. locations in New Jersey and California, has announced its new line of Spectro XEPOS spectrometers, featuring energy dispersive X-ray fluorescence (ED-XRF) technology and providing advances in the multielemental analysis of major, minor and trace element concentrations, the company says.

The new line of Spectro XEPOS spectrometers features:

• high-count detector and tube designs, new sensitivity, minimized backgrounds and proprietary adaptive excitation technology, enabling low limits of detection (LODs) for a wide range of elements;
• X-ray tubes that remain powered on between measurements to prevent on/off variations from affecting readings, realizing a high degree of precision in elemental analysis and delivering improved analytical accuracy for concentrations from trace elements to major components, according to Spectro; and
• high speed operation that helps to achieve analyses of most samples within a few minutes.

The analyzer’s operating software has been redesigned, while the new TurboQuant II software quickly and accurately analyzes practically any unknown liquid, powder or solid sample, the company says.

“In addition, the new Spectro XEPOS spectrometers exhibit a significantly lower cost of ownership than wavelength dispersive X-ray fluorescence (WD-XRF) spectrometers—thus delivering WD performance at an ED price for many applications,” Spectro says.

Optional AMECARE M2M (machine-to-machine) support extends the new analyzers’ self-diagnostic functions with proactive alerts and is backed up by direct connection with a remote Spectro service expert’s PC.

The Spectro XEPOS ED-XRF spectrometers are available in four versions, enabling users to prioritize their selections according to measurement speed, ultimate precision or groups of targeted elements in specific matrices.

More information is available at www.spectro.com/xepos or by emailing spectro.info@ametek.com.